Maria Toledano-Luque, Peter C. Paliwoda, M. Nour, Thomas Kauerauf, B. Min, G. Bossu, M. Siddabathula, Tanya Nigam. Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{Toledano-LuqueP21,
title = {Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area},
author = {Maria Toledano-Luque and Peter C. Paliwoda and M. Nour and Thomas Kauerauf and B. Min and G. Bossu and M. Siddabathula and Tanya Nigam},
year = {2021},
doi = {10.1109/IRPS46558.2021.9405151},
url = {https://doi.org/10.1109/IRPS46558.2021.9405151},
researchr = {https://researchr.org/publication/Toledano-LuqueP21},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021},
publisher = {IEEE},
isbn = {978-1-7281-6893-7},
}