Shigeki Tomishima, Hiroaki Tanizaki, Mitsutaka Niiro, Masanao Maruta, Hideto Hidaka, T. Tada, Kenji Gamo. A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 170-177, IEEE Computer Society, 2002. [doi]
@inproceedings{TomishimaTNMHTG02,
title = {A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test},
author = {Shigeki Tomishima and Hiroaki Tanizaki and Mitsutaka Niiro and Masanao Maruta and Hideto Hidaka and T. Tada and Kenji Gamo},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430170abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/TomishimaTNMHTG02},
cites = {0},
citedby = {0},
pages = {170-177},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}