Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang. On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. IEICE Transactions, 97-D(10):2706-2718, 2014. [doi]
Abstract is missing.