Rasit Onur Topaloglu. Standard Cell and Custom Circuit Optimization using Dummy Diffusions through STI Width Stress Effect Utilization. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 619-622, IEEE, 2007. [doi]
Abstract is missing.