Giulio Torrente, Jean Coignus, Sophie Renard, Alexandre Vernhet, Gilles Reimbold, David Roy 0001, Gérard Ghibaudo. Physically-based extraction methodology for accurate MOSFET degradation assessment. Microelectronics Reliability, 55(9-10):1417-1421, 2015. [doi]
@article{TorrenteCRVR0G15,
title = {Physically-based extraction methodology for accurate MOSFET degradation assessment},
author = {Giulio Torrente and Jean Coignus and Sophie Renard and Alexandre Vernhet and Gilles Reimbold and David Roy 0001 and Gérard Ghibaudo},
year = {2015},
doi = {10.1016/j.microrel.2015.06.063},
url = {http://dx.doi.org/10.1016/j.microrel.2015.06.063},
researchr = {https://researchr.org/publication/TorrenteCRVR0G15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {9-10},
pages = {1417-1421},
}