R. L. Torrisi, Salvatore Adamo, Mario Santo Alessandrino, Cettina Bottari, Beatrice Carbone, M. Palmisciano, Elisa Vitanza. Failure Analysis of AlGaN/GaN Power HEMTs through an innovative sample preparation approach. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 19-1, IEEE, 2022. [doi]
Abstract is missing.