Implementation of TRE systems into Emission Microscopes

Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu. Implementation of TRE systems into Emission Microscopes. Microelectronics Reliability, 44(9-11):1529-1534, 2004. [doi]

Authors

Alberto Tosi

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Mustapha Remmach

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Romain Desplats

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Franco Zappa

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Philippe Perdu

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