Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu. Implementation of TRE systems into Emission Microscopes. Microelectronics Reliability, 44(9-11):1529-1534, 2004. [doi]
@article{TosiRDZP04,
title = {Implementation of TRE systems into Emission Microscopes},
author = {Alberto Tosi and Mustapha Remmach and Romain Desplats and Franco Zappa and Philippe Perdu},
year = {2004},
doi = {10.1016/j.microrel.2004.07.034},
url = {http://dx.doi.org/10.1016/j.microrel.2004.07.034},
researchr = {https://researchr.org/publication/TosiRDZP04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {9-11},
pages = {1529-1534},
}