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Analysis of RRAM Reliability Soft-Errors on the Performance of RRAM-Based Neuromorphic Systems

Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei. Analysis of RRAM Reliability Soft-Errors on the Performance of RRAM-Based Neuromorphic Systems. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 62-67, IEEE, 2017. [doi]

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Amr M. S. Tosson

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Shimeng Yu

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Mohab H. Anis

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Lan Wei

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