Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei. Analysis of RRAM Reliability Soft-Errors on the Performance of RRAM-Based Neuromorphic Systems. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 62-67, IEEE, 2017. [doi]
@inproceedings{TossonYAW17-0,
title = {Analysis of RRAM Reliability Soft-Errors on the Performance of RRAM-Based Neuromorphic Systems},
author = {Amr M. S. Tosson and Shimeng Yu and Mohab H. Anis and Lan Wei},
year = {2017},
doi = {10.1109/ISVLSI.2017.20},
url = {https://doi.org/10.1109/ISVLSI.2017.20},
researchr = {https://researchr.org/publication/TossonYAW17-0},
cites = {0},
citedby = {0},
pages = {62-67},
booktitle = {2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017},
publisher = {IEEE},
isbn = {978-1-5090-6762-6},
}