A Study of the Effect of RRAM Reliability Soft Errors on the Performance of RRAM-Based Neuromorphic Systems

Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei. A Study of the Effect of RRAM Reliability Soft Errors on the Performance of RRAM-Based Neuromorphic Systems. IEEE Trans. VLSI Syst., 25(11):3125-3137, 2017. [doi]

Authors

Amr M. S. Tosson

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Shimeng Yu

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Mohab H. Anis

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Lan Wei

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