Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei. A Study of the Effect of RRAM Reliability Soft Errors on the Performance of RRAM-Based Neuromorphic Systems. IEEE Trans. VLSI Syst., 25(11):3125-3137, 2017. [doi]
@article{TossonYAW17-1,
title = {A Study of the Effect of RRAM Reliability Soft Errors on the Performance of RRAM-Based Neuromorphic Systems},
author = {Amr M. S. Tosson and Shimeng Yu and Mohab H. Anis and Lan Wei},
year = {2017},
doi = {10.1109/TVLSI.2017.2734819},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2017.2734819},
researchr = {https://researchr.org/publication/TossonYAW17-1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {25},
number = {11},
pages = {3125-3137},
}