Aymen Touati, Alberto Bosio, Patrick Girard 0001, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda. Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016. pages 731-736, IEEE, 2016. [doi]
@inproceedings{TouatiB0VBR16,
title = {Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study},
author = {Aymen Touati and Alberto Bosio and Patrick Girard 0001 and Arnaud Virazel and Paolo Bernardi and Matteo Sonza Reorda},
year = {2016},
doi = {10.1109/ISVLSI.2016.42},
url = {http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2016.42},
researchr = {https://researchr.org/publication/TouatiB0VBR16},
cites = {0},
citedby = {0},
pages = {731-736},
booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016},
publisher = {IEEE},
isbn = {978-1-4673-9039-2},
}