Nur A. Touba, Edward J. McCluskey. Altering a Pseudo-Random Bit Sequence for Scan-Based BIST. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 167-175, IEEE Computer Society, 1996.
@inproceedings{ToubaM96:0,
title = {Altering a Pseudo-Random Bit Sequence for Scan-Based BIST},
author = {Nur A. Touba and Edward J. McCluskey},
year = {1996},
tags = {rule-based},
researchr = {https://researchr.org/publication/ToubaM96%3A0},
cites = {0},
citedby = {0},
pages = {167-175},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}