Ignace Tchangou Toudjeu, Barend J. van Wyk, Michaël A. van Wyk, Frans van den Bergh. Global Image Feature Extraction Using Slope Pattern Spectra. In Aurélio C. Campilho, Mohamed S. Kamel, editors, Image Analysis and Recognition, 5th International Conference, ICIAR 2008, Póvoa de Varzim, Portugal, June 25-27, 2008. Proceedings. Volume 5112 of Lecture Notes in Computer Science, pages 640-649, Springer, 2008. [doi]
@inproceedings{ToudjeuWWB08,
title = {Global Image Feature Extraction Using Slope Pattern Spectra},
author = {Ignace Tchangou Toudjeu and Barend J. van Wyk and Michaël A. van Wyk and Frans van den Bergh},
year = {2008},
doi = {10.1007/978-3-540-69812-8_63},
url = {http://dx.doi.org/10.1007/978-3-540-69812-8_63},
researchr = {https://researchr.org/publication/ToudjeuWWB08},
cites = {0},
citedby = {0},
pages = {640-649},
booktitle = {Image Analysis and Recognition, 5th International Conference, ICIAR 2008, Póvoa de Varzim, Portugal, June 25-27, 2008. Proceedings},
editor = {Aurélio C. Campilho and Mohamed S. Kamel},
volume = {5112},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-540-69811-1},
}