Ignace Tchangou Toudjeu, Barend J. van Wyk, Michaël A. van Wyk, Frans van den Bergh. Global Image Feature Extraction Using Slope Pattern Spectra. In Aurélio C. Campilho, Mohamed S. Kamel, editors, Image Analysis and Recognition, 5th International Conference, ICIAR 2008, Póvoa de Varzim, Portugal, June 25-27, 2008. Proceedings. Volume 5112 of Lecture Notes in Computer Science, pages 640-649, Springer, 2008. [doi]
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