Gerard Touma, Rouwaida Kanj, Rajiv V. Joshi, Ayman I. Kayssi, Ali Chehab. Robust bias temperature instability refresh design and methodology for memory cell recovery. In 2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014. pages 1-4, IEEE, 2014. [doi]
@inproceedings{ToumaKJKC14,
title = {Robust bias temperature instability refresh design and methodology for memory cell recovery},
author = {Gerard Touma and Rouwaida Kanj and Rajiv V. Joshi and Ayman I. Kayssi and Ali Chehab},
year = {2014},
doi = {10.1109/ICICDT.2014.6838603},
url = {http://dx.doi.org/10.1109/ICICDT.2014.6838603},
researchr = {https://researchr.org/publication/ToumaKJKC14},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014},
publisher = {IEEE},
isbn = {978-1-4799-2153-9},
}