Resonant Multi-Dielectric Coverslip for Enhanced Total Internal Reflection Fluorescence Microscopy

Y. Toumi, A. Mouttou, Florian Lemarchand, Guillaume Demésy, C. Koc, D. Muriaux, A. Moreau, J. Lumeau, C. Favard, Aude L. Lereu. Resonant Multi-Dielectric Coverslip for Enhanced Total Internal Reflection Fluorescence Microscopy. In 23rd International Conference on Transparent Optical Networks, ICTON 2023, Bucharest, Romania, July 2-6, 2023. pages 1-3, IEEE, 2023. [doi]

Abstract

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