Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature - researchr publication authors

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M. Tounsi, A. Oukaour, Boubekeur Tala-Ighil, H. Gualous, B. Boudart, D. Aissani. Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. Microelectronics Reliability, 50(9-11):1810-1814, 2010. [doi]

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