Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature

M. Tounsi, A. Oukaour, Boubekeur Tala-Ighil, H. Gualous, B. Boudart, D. Aissani. Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. Microelectronics Reliability, 50(9-11):1810-1814, 2010. [doi]

Abstract

Abstract is missing.