M. Tounsi, A. Oukaour, Boubekeur Tala-Ighil, H. Gualous, B. Boudart, D. Aissani. Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. Microelectronics Reliability, 50(9-11):1810-1814, 2010. [doi]
@article{TounsiOTGBA10,
title = {Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature},
author = {M. Tounsi and A. Oukaour and Boubekeur Tala-Ighil and H. Gualous and B. Boudart and D. Aissani},
year = {2010},
doi = {10.1016/j.microrel.2010.07.059},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.059},
tags = {testing},
researchr = {https://researchr.org/publication/TounsiOTGBA10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1810-1814},
}