A Jittered-Sampling Correction Technique for ADCs

Jamiil Tourabaly, Adam Osseiran. A Jittered-Sampling Correction Technique for ADCs. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 249-252, IEEE Computer Society, 2008. [doi]

Authors

Jamiil Tourabaly

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Adam Osseiran

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