Jamiil Tourabaly, Adam Osseiran. A Jittered-Sampling Correction Technique for ADCs. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 249-252, IEEE Computer Society, 2008. [doi]
@inproceedings{TourabalyO08,
title = {A Jittered-Sampling Correction Technique for ADCs},
author = {Jamiil Tourabaly and Adam Osseiran},
year = {2008},
doi = {10.1109/DELTA.2008.79},
url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.79},
researchr = {https://researchr.org/publication/TourabalyO08},
cites = {0},
citedby = {0},
pages = {249-252},
booktitle = {4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008},
publisher = {IEEE Computer Society},
}