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LATCH: A Locality-Aware Taint CHecker

Daniel Townley, Khaled N. Khasawneh, Dmitry Ponomarev, Nael B. Abu-Ghazaleh, Lei Yu 0001. LATCH: A Locality-Aware Taint CHecker. In Proceedings of the 52nd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2019, Columbus, OH, USA, October 12-16, 2019. pages 969-982, ACM, 2019. [doi]

Authors

Daniel Townley

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Khaled N. Khasawneh

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Dmitry Ponomarev

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Nael B. Abu-Ghazaleh

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Lei Yu 0001

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