Daniel Townley, Khaled N. Khasawneh, Dmitry Ponomarev, Nael B. Abu-Ghazaleh, Lei Yu 0001. LATCH: A Locality-Aware Taint CHecker. In Proceedings of the 52nd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2019, Columbus, OH, USA, October 12-16, 2019. pages 969-982, ACM, 2019. [doi]
@inproceedings{TownleyKPA019,
title = {LATCH: A Locality-Aware Taint CHecker},
author = {Daniel Townley and Khaled N. Khasawneh and Dmitry Ponomarev and Nael B. Abu-Ghazaleh and Lei Yu 0001},
year = {2019},
doi = {10.1145/3352460.3358327},
url = {https://doi.org/10.1145/3352460.3358327},
researchr = {https://researchr.org/publication/TownleyKPA019},
cites = {0},
citedby = {0},
pages = {969-982},
booktitle = {Proceedings of the 52nd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2019, Columbus, OH, USA, October 12-16, 2019},
publisher = {ACM},
isbn = {978-1-4503-6938-1},
}