Daniel Townley, Khaled N. Khasawneh, Dmitry Ponomarev, Nael B. Abu-Ghazaleh, Lei Yu 0001. LATCH: A Locality-Aware Taint CHecker. In Proceedings of the 52nd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2019, Columbus, OH, USA, October 12-16, 2019. pages 969-982, ACM, 2019. [doi]
Abstract is missing.