External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Tags

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

An Analysis of the Die Testing Process Using Taguchi Techniques and Circuit Diagnostics

Robert Trahan, Rex Kiang. An Analysis of the Die Testing Process Using Taguchi Techniques and Circuit Diagnostics. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 260-269, IEEE Computer Society, 1992.

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.

runs on