Towards digital circuit approximation by exploiting fault simulation

Marcello Traiola, Arnaud Virazel, Patrick Girard 0001, Mario Barbareschi, Alberto Bosio. Towards digital circuit approximation by exploiting fault simulation. In 2017 IEEE East-West Design & Test Symposium, EWDTS 2017, Novi Sad, Serbia, September 29 - October 2, 2017. pages 1-7, IEEE Computer Society, 2017. [doi]

No reviews for this publication, yet.