Ringing Test for Third-Order Ladder Low-Pass Filters

MinhTri Tran, Anna Kuwana, Haruo Kobayashi 0001. Ringing Test for Third-Order Ladder Low-Pass Filters. In 11th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conference, UEMCON 2020, New York City, NY, USA, October 28-31, 2020. pages 440-446, IEEE, 2020. [doi]

Authors

MinhTri Tran

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Anna Kuwana

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Haruo Kobayashi 0001

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