Ringing Test for Third-Order Ladder Low-Pass Filters

MinhTri Tran, Anna Kuwana, Haruo Kobayashi 0001. Ringing Test for Third-Order Ladder Low-Pass Filters. In 11th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conference, UEMCON 2020, New York City, NY, USA, October 28-31, 2020. pages 440-446, IEEE, 2020. [doi]

@inproceedings{TranK020,
  title = {Ringing Test for Third-Order Ladder Low-Pass Filters},
  author = {MinhTri Tran and Anna Kuwana and Haruo Kobayashi 0001},
  year = {2020},
  doi = {10.1109/UEMCON51285.2020.9298143},
  url = {https://doi.org/10.1109/UEMCON51285.2020.9298143},
  researchr = {https://researchr.org/publication/TranK020},
  cites = {0},
  citedby = {0},
  pages = {440-446},
  booktitle = {11th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conference, UEMCON 2020, New York City, NY, USA, October 28-31, 2020},
  publisher = {IEEE},
  isbn = {978-1-7281-9656-5},
}