Ringing Test for Third-Order Ladder Low-Pass Filters

MinhTri Tran, Anna Kuwana, Haruo Kobayashi 0001. Ringing Test for Third-Order Ladder Low-Pass Filters. In 11th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conference, UEMCON 2020, New York City, NY, USA, October 28-31, 2020. pages 440-446, IEEE, 2020. [doi]

Abstract

Abstract is missing.