Yen Tran, Toshihiro Nomura, Mohamed Salim Cherchali, Claire Tassin, Yann Deval, Cristell Maneux. Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions. In 30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021. pages 97-102, IEEE, 2021. [doi]
Abstract is missing.