C. Trapes, D. Goguenheim, A. Bravaix. Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides. Microelectronics Reliability, 45(5-6):883-886, 2005. [doi]
@article{TrapesGB05,
title = {Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides},
author = {C. Trapes and D. Goguenheim and A. Bravaix},
year = {2005},
doi = {10.1016/j.microrel.2004.10.025},
url = {http://dx.doi.org/10.1016/j.microrel.2004.10.025},
tags = {C++},
researchr = {https://researchr.org/publication/TrapesGB05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {5-6},
pages = {883-886},
}