Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides

C. Trapes, D. Goguenheim, A. Bravaix. Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides. Microelectronics Reliability, 45(5-6):883-886, 2005. [doi]

Abstract

Abstract is missing.