Mareike Trappen, Matthias Blaicher, Philipp-Immanuel Dietrich, Tobias Hoose, Yilin Xu, Muhammad Rodlin Billah, Wolfgang Freude, Christian Koos. 3D-Printed Optics for Wafer-Scale Probing. In European Conference on Optical Communication, ECOC 2018, Rome, Italy, September 23-27, 2018. pages 1-3, IEEE, 2018. [doi]
Abstract is missing.