Data association with ambiguous measurements

Matthew J. Travers, Todd Murphey, Lucy Y. Pao. Data association with ambiguous measurements. In American Control Conference, ACC 2008, Seattle, WA, USA, 11-13 June 2008. pages 1875-1880, IEEE, 2008. [doi]

Authors

Matthew J. Travers

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Todd Murphey

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Lucy Y. Pao

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