Matthew J. Travers, Todd Murphey, Lucy Y. Pao. Data association with ambiguous measurements. In American Control Conference, ACC 2008, Seattle, WA, USA, 11-13 June 2008. pages 1875-1880, IEEE, 2008. [doi]
@inproceedings{TraversMP08, title = {Data association with ambiguous measurements}, author = {Matthew J. Travers and Todd Murphey and Lucy Y. Pao}, year = {2008}, doi = {10.1109/ACC.2008.4586765}, url = {https://doi.org/10.1109/ACC.2008.4586765}, researchr = {https://researchr.org/publication/TraversMP08}, cites = {0}, citedby = {0}, pages = {1875-1880}, booktitle = {American Control Conference, ACC 2008, Seattle, WA, USA, 11-13 June 2008}, publisher = {IEEE}, }