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Processor core profiling for SEU effect analysis

Rodrigo Travessini, Paulo Ricardo Cechelero Villa, Fabian Luis Vargas, Eduardo Augusto Bezerra. Processor core profiling for SEU effect analysis. In 19th IEEE Latin-American Test Symposium, LATS 2018, Sao Paulo, Brazil, March 12-14, 2018. pages 1-6, IEEE, 2018. [doi]

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