Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer. High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 74-80, IEEE Computer Society, 2014. [doi]
@inproceedings{TrawkaMMPRJT14,
title = {High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs},
author = {Maciej Trawka and Grzegorz Mrugalski and Nilanjan Mukherjee and Artur Pogiel and Janusz Rajski and Jakub Janicki and Jerzy Tyszer},
year = {2014},
doi = {10.1109/ATS.2014.25},
url = {http://dx.doi.org/10.1109/ATS.2014.25},
researchr = {https://researchr.org/publication/TrawkaMMPRJT14},
cites = {0},
citedby = {0},
pages = {74-80},
booktitle = {23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-6030-9},
}