Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer. High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 74-80, IEEE Computer Society, 2014. [doi]
Abstract is missing.