Renan Trevisoli, Rodrigo Doria, Sylvain Barraud, Marcelo Antonio Pavanello. Compact Analytical Model for Trap-Related Low Frequency Noise in Junctionless Transistors. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 194-197, IEEE, 2019. [doi]
Abstract is missing.