An Efficient Heuristic for Peak Capture Power Minimization During Scan-Based Test

Satya Trinadh, Seetal Potluri, Ch. Sobhan Babu, V. Kamakoti. An Efficient Heuristic for Peak Capture Power Minimization During Scan-Based Test. J. Low Power Electronics, 9(2):264-274, 2013. [doi]

Authors

Satya Trinadh

This author has not been identified. Look up 'Satya Trinadh' in Google

Seetal Potluri

This author has not been identified. Look up 'Seetal Potluri' in Google

Ch. Sobhan Babu

This author has not been identified. Look up 'Ch. Sobhan Babu' in Google

V. Kamakoti

This author has not been identified. Look up 'V. Kamakoti' in Google