Satya Trinadh, Seetal Potluri, Ch. Sobhan Babu, V. Kamakoti. An Efficient Heuristic for Peak Capture Power Minimization During Scan-Based Test. J. Low Power Electronics, 9(2):264-274, 2013. [doi]
@article{TrinadhPBK13,
title = {An Efficient Heuristic for Peak Capture Power Minimization During Scan-Based Test},
author = {Satya Trinadh and Seetal Potluri and Ch. Sobhan Babu and V. Kamakoti},
year = {2013},
doi = {10.1166/jolpe.2013.1255},
url = {http://dx.doi.org/10.1166/jolpe.2013.1255},
researchr = {https://researchr.org/publication/TrinadhPBK13},
cites = {0},
citedby = {0},
journal = {J. Low Power Electronics},
volume = {9},
number = {2},
pages = {264-274},
}