An Efficient Heuristic for Peak Capture Power Minimization During Scan-Based Test

Satya Trinadh, Seetal Potluri, Ch. Sobhan Babu, V. Kamakoti. An Efficient Heuristic for Peak Capture Power Minimization During Scan-Based Test. J. Low Power Electronics, 9(2):264-274, 2013. [doi]

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