Drive only at speed functional testing; one of the techniques Intel is using to control test costs - researchr publication authors

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Mike Tripp, Silvio Picano, Baruch Schnarch. Drive only at speed functional testing; one of the techniques Intel is using to control test costs. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 8, IEEE, 2005. [doi]

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