Mike Tripp, Silvio Picano, Baruch Schnarch. Drive only at speed functional testing; one of the techniques Intel is using to control test costs. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 8, IEEE, 2005. [doi]
@inproceedings{TrippPS05,
title = {Drive only at speed functional testing; one of the techniques Intel is using to control test costs},
author = {Mike Tripp and Silvio Picano and Baruch Schnarch},
year = {2005},
doi = {10.1109/TEST.2005.1583969},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583969},
researchr = {https://researchr.org/publication/TrippPS05},
cites = {0},
citedby = {0},
pages = {8},
booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
publisher = {IEEE},
isbn = {0-7803-9038-5},
}