Amit Ranjan Trivedi, Saibal Mukhopadhyay. Self-adaptive power gating with test circuit for on-line characterization of energy inflection activity. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 38-43, IEEE, 2012. [doi]
Abstract is missing.