1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations

Du-Ming Tsai, Su-Ta Chuang. 1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations. Mach. Vis. Appl., 20(6):423-434, 2009. [doi]

Authors

Du-Ming Tsai

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Su-Ta Chuang

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