Du-Ming Tsai, Su-Ta Chuang. 1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations. Mach. Vis. Appl., 20(6):423-434, 2009. [doi]
@article{TsaiC09-8,
title = {1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations},
author = {Du-Ming Tsai and Su-Ta Chuang},
year = {2009},
doi = {10.1007/s00138-008-0136-0},
url = {http://dx.doi.org/10.1007/s00138-008-0136-0},
researchr = {https://researchr.org/publication/TsaiC09-8},
cites = {0},
citedby = {0},
journal = {Mach. Vis. Appl.},
volume = {20},
number = {6},
pages = {423-434},
}