Test Coverage Analysis for Designs with Timing Exceptions

Kun-Han Tsai, Srinivasan Gopalakrishnan. Test Coverage Analysis for Designs with Timing Exceptions. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 169-174, IEEE Computer Society, 2017. [doi]

Authors

Kun-Han Tsai

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Srinivasan Gopalakrishnan

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